Showing results: 76 - 89 of 89 items found.
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Anfatec Instruments AG
Vista-IR combines AFM with IR (AFM-IR) spectroscopy to provide IR spectral imaging with unprecedented sub-10 nm spatial resolution. Its patented photo-induced force microscopy (PiFM) measures the near-field optical response of the sample via mechanical force detection, making the technique robust and easy-to-use. Reliable and repeatable PiFM spectrum from 10-nm region provides “nano-FTIR” spectrum in less than a second.
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EMAG Technologies Inc..
NeoScan® is a unique electric field measurement system with unprecedented innovative features. NeoScan systems utilize EMAG’s patented, electro-optic (EO) field probe technology. Unlike conventional near-field scanning systems that require metallic pickup radiators or sensors, NeoScan probes are made of absolutely metal-free parts.
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VistaScope -
Anfatec Instruments AG
VistaScope is a unique AFM with flexible & full optical access to the tip/sample region. The VistaScope controller comes equipped with multiple lock-in amplifiers that allow patented photo-induced force microscopy (PiFM) and patented demodulation technique for background suppressed scattering scanning near-field optical microscopy (s-SNOM). It provides the ultimate capability in tip-enhanced optical microscopy as well as co-located AFM and far field optical techniques such as confocal Raman and confocal photoluminescence.
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Teledyne Marine Real Time Systems
Teledyne Real Time Systems’ new SmartPhone D system represents decades of experience in marine seismic exploration, and is the next generation of digital marine acoustic Near-Field Hydrophone (NFH) systems. This new product provides high speed 24-bit data acquisition of near-field hydrophone channels. Recorded data are available in SEGY or SEGD format.
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RiGO801 -
TechnoTeam Bildverarbeitung GmbH
Correct determination of the luminous intensity distributions (lid) of lamps and luminaires far within their photometric near-field range. Capture of ray data.
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NSI-MI Technologies
NSI-MI is the world leader in providing turn-key near-field antenna measurement systems with over 450 systems delivered worldwide. NSI-MI offers systems ranging in size from tabletop designs to large precision systems for a wide variety of applications. Our customers use our systems for testing in aerospace and defense, commercial, wireless, automotive and many other applications. Our systems are available in a wide variety of standard configurations as well as being easy to customize to your specific application.
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alpha300 Series -
WITec
Alpha300 series consists of advanced Raman, Atomic Force Microscopy (AFM) and Scanning Near-field Optical Microscopy (SNOM) imaging systems. Its sophisticated design ensures exceptionally high-throughput and sensitivity. A unique modularity allows for single-technique solutions as well as correlative imaging configurations.
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FieldSENSE 60 -
LBA Group, Inc
The fieldSENSE 60 personal RF monitor has a proven track record of durability that works as hard as you do. fieldSENSE 60 is specifically designed with the RF climber in mind. Whether working in the nearfield of a broadcast system or in the far-field of a 5G system, exposure is correctly assessed and a warning is sounded, should the levels approach and exceed the OET65 and Safety Code 6 occupational limits. To ensure the device cannot be dropped off site, connect he device can be attached the included special harness-attachment mechanism. In the event of a warning while the monitor has fallen the buzzer is still within hearing range.
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VTC 4000 -
Instrument Systems Optische Messtechnik GmbH
The VTC 4000 near-field camera from Instrument Systems was specially developed for the ultrafast, precise 2D analysis of VCSEL arrays. It enables polarization-controlled characterization of all relevant parameters simultaneously for the single emitters of the array.
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MultiView 2000 -
Nanonics Imaging Ltd.
an advanced single probe scanning probe microscope enabling a variety of modes of AFM/SPM/NSOM imaging. Nanonics has designed The MultiView 2000TM for excellence in scanning probe microscopy while allowing for near-field and far-field optical NSOM/Raman/TERS imaging without perturbation. The Multiview 2000TM is the only commercially available instrument that offers both tip and sample scanning. This versatility is important for different operation modes where the user can now choose whether the sample or tip is static. The Multiview 2000TM further offers the most stable feedback mechanism available in the form of normal force feedback with tuning fork actuation.
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LF1 set -
Langer EMV-Technik GmbH
The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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Cuming-Lehman Chambers
Most antenna measurements need to be carried out in the far field; that is, the test antenna should be illuminated by a plane wave. Typically this is carried out by providing sufficient separation between the source and the AUT so the spherical wave approaches a plane-wave character.Near-Field chambers are an excellent alternative to traditional far-field ranges; testing that can be accomplished on a far-field range can be accomplished on a Near-Field test range. This method of testing allows an operator to employ an indoor anechoic test chamber at a reasonable cost and avoid the problems associated with weather and security concerns often encountered when using an outdoor test range.
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ICEy -
Schmid & Partner Engineering AG
ICEy is the most advanced reactive near-field E/H-field scanning system for the analysis of EM interference and compatibility (EMI/EMC) in highly integrated electronics. ICEy is the only system that provides accurate EM measurements traceable to international calibration standards and also allows independent interlaboratory comparability of EMI/EMC measurement results.
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Radiant Vision Systems, llc
Radiant Vision Systems fully-automated goniometric systems are combined with a ProMetric® Imaging Colorimeter or Photometer and specialized software to capture a precise, comprehensive model of a light source’s near-field output.
